LitePoint IQview® 802.11a/b/g/n WLAN Test Solution is an all-in-one test instrument developed specifically for RF testing of 802.11a/b/g/n WLAN products, including MIMO and optional Bluetooth + EDR, such as network interface cards, access points and embedded components.

　　Suitable for development and manufacturing environments, LitePoint IQview integrates a vector signal analyzer (VSA) and a vector signal generator (VSG) into a single, small form-factor box. The tester’s VSA capability replaces traditional spectrum analyzers and power meters, enabling the user to analyze a device under test’s transmitter output and perform true error vector magnitude (EVM) measurements.

• IQview 802.11a/b/g/n WLAN R&D Test Solution (Brochures)
• IQview 802.11a/b/g/n WLAN Test Solution (Datasheets)

Features 

• Seamless analysis of DSSS (802.11b/g) and OFDM (802.11a/g) WLAN signals

• Advanced VSA and VSG combined with the capabilities of a power meter and spectrum analyzer in a single instrument

• Operation in both 2.4 GHz and 5 GHz bands

• Baseband I/O facilitates product debugging with LitePoint IQdebug™ Monitor and Control Tool

• High-performance VSA

  • Wide bandwidth (±33 MHz)

  • Capture-once-measure-all operation

  • High phase linearity, low phase noise, low noise figure

  • Graphical and numerical display of measurement results

• High-performance VSG

  • Low noise figure

  • Pre-defined 802.11a/b/g transmit test signals

  • Impairments can be introduced in real- time to the transmit test signal

  • Generation of arbitrary 802.11a/b/g waveforms simplified by optional IQwave WLAN Waveform Generator Software

• Simple control interfaces

  • IQsignal Signal Analysis Software Suite  facilitates signal analysis, signal generation, and debugging

  • LitePoint API (IQapi™) supports Visual C/C++ test scripts for use in manufacturing

 Benefits 

• Faster test time

  • Test time reduced by from minutes per device to seconds compared to separate instruments for VSA, spectrum analyzer and power meter

  • Independent simultaneous Rx and Tx measurements

  • Support for dual-head test functionality

• Faster time to production

  • Intuitive user interface means no learning curve

  • No complicated test set-up or calibration; tests are pre-configured

  • Easy to re-configure manufacturing stations to test different chipsets

  • Consistent test results across R&D and manufacturing for quick identification and fix of problems

• Consistent quality and performance assured

  • Direct measurement of transmitter performance using EVM and other signal quality metrics

  • Efficient and repeatable measurements

  • Ability to capture, analyze and debug raw signal data on any PC

• Capital investment protected

  • One-box tester solution eliminates need for multiple test products

  • No other equipment or software required

  • Software upgrades ensure compliance with standards changes