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Signal
Source Analyzer
相位雜訊測試系統 |
 
APPH6000 (Product
Brief, Data
Sheet)
10 MHz to 6200 MHz Signal Source Analyzer
相位雜訊測試系統
為一種小型模組化全自動訊號分析儀器，擁有快速與準確量測功能可運用於相位雜訊，振福雜訊，振盪特性等測試與合成器的鎖定分析。
主要特色 :
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All-in-one measurement
system
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SSB Phase Noise
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AM Noise
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Baseband Noise Analyzer
(Supply, external Detectors)
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Transient Measurements
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Component
characterization (Kvco, Pushing, etc)
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Fully automated, fast,
reliable and accurate measurement
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Auto-level and frequency
detection and loop setting
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Low residual noise floor
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Available with Internal or
external reference source
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Remote control via USB and
LAN and convenient graphical user interface
應用 :
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Automated (Crystal)
oscillator production testing
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R&D Signal Analyzer Test
System
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VCO characterization
(frequency/power/Pushing/Kvco)
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Clock jitter measurement
with femto-second resolution
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